Technical Diagnostics and Non-Destructive Testing, 2026, №02

2026 №02 (05)

DOI of Article 10.37434/tdnk2026.02.06

2026 №02 (01)

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"Tekhnichna Diahnostyka ta Neruinivnyi Kontrol" (Technical Diagnostics and Non-Destructive Testing) #2, 2026, pp. 51-58

Spectral correspondence of X-ray screen to the sensor in X-ray television systems

S.R. Mikhailov^1,2

¹National Technical University of Ukraine «Igor Sikorsky Kyiv Polytechnic Institute». 37 Beresteysky Ave., 03056, Kyiv, Ukraine. E-mail: smihajlov@ukr.net
²E.O. Paton Electric Welding Institute of the NAS of Ukraine. 11 Kazymyr Malevych Str., 03150, Kyiv, Ukraine. Email: ndt@paton.kiev.ua

Film radiography is still a common method of non-destructive quality control of materials and products in all industries due to the well-established regulatory framework and existing infrastructure (photo laboratories, equipment, qualified personnel, etc.). However, significant disadvantages of film radiography (low productivity and high cost of control, inability to control objects in real time) stimulate the development of new methods of recording X-ray images, in particular digital radiography. Digital radiography is implemented using digital X-ray television systems. Currently, various digital X-ray television systems are used: systems based on X-ray electron-optical converters, scanning systems based on linear detectors, systems based on semiconductor flat-panel detectors, systems of the “X-ray screen – optics – CCD-(CMOS-) sensor” type, etc. The latter systems have a number of advantages over others: high control sensitivity and spatial resolution; the ability to change the X-ray scintillation screen, which allows you to change the size of the working field and other system parameters; short image acquisition time; simplicity of design; small dimensions and weight; low cost. To ensure high sensitivity of control, highly sensitive CCD- (CMOS-) sensors, high-aperture lenses and X-ray screens with high conversion efficiency are used. However, an important condition for achieving high control sensitivity is the correspondence of the spectral characteristic of X-ray radiation to the spectral characteristic of the sensitivity of the CCD- (CMOS-) sensor. The aim of the work is to study the spectral correspondence of the most common and effective X-ray screens to a number of modern CCD-(CMOS-) sensors. Calculations of spectral correspondence coefficients for scintillation X-ray screens to CCD- and CMOS-sensors have been performed. To calculate the spectral matching coefficients, the ratio of the sensitivity of CCD and CMOS sensors to the spectrum emitted by the screen to the maximum sensitivity of the sensor was used. A table of spectral matching coefficients of X-ray screens to CCD-(CMOS-) sensors was constructed. It was determined that the best spectral matching is achieved by combinations of the Gd2O2S(Tb) screen and the CCD-sensor ICX285AL, the CMOS-sensor IMX421, the CCD-sensor ICX674ALG, the CMOS-sensor MT9M034 and the CMOS-sensor IMX174. 16 Ref., 1 Tabl., 6 Fig.
Keywords: digital radiography, X-ray television system, X-ray screen, CCD sensor, CMOS sensor, mutual spectral matching

Received: 30.03.2026
Received in revised form: 27.04.2026
Accepted: 01.06.2026
Posted online: 30.06.2026

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Suggested Citation

S.R. Mikhailov (2026) Spectral correspondence of X-ray screen to the sensor in X-ray television systems. Technical Diagnostics and Non-Destructive Testing, 02, 51-58. https://doi.org/10.37434/tdnk2026.02.06