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2026 №03 (01) 2026 №03 (03)

Technical Diagnostics and Non-Destructive Testing 2026 #03
"Tekhnichna Diahnostyka ta Neruinivnyi Kontrol" (Technical Diagnostics and Non-Destructive Testing) #3, 2026, pp. 28-37

Automated detection of defective areas in a multilayer thin-walled structure with periodic configuration by laser interferometry methods

L.M. Lobanov, I.L. Shkurat, O.P. Shutkevych, I.V. Kyianets, V.V. Savitsky

E.O. Paton Electric Welding Institute of the NAS of Ukraine 11 Kazymyr Malevych Str., 03150, Kyiv, Ukraine. E-mail: innashkurat2909@gmail.com

Modeling and data analysis methods were applied to detect and evaluate deformations in thin-walled structures, in particular in welded multilayer panels. The use of finite element method enabled the characteristic spatial deformation profiles and their relationship with defect localization to be established. Fourier analysis and differentiation techniques were used to develop an algorithm for the automated detection of defective areas in thin-walled structures. It is shown that using the displacement derivative ∂w/∂y provides clearer defect localization compared to analysis of displacements alone. This substantiates the feasibility of applying the shearography method as one of the most informative approaches to the non-destructive testing of such structures. The obtained results are confirmed by both numerical and experimental data, indicating the suitability of the methodology for diagnosing a wide class of thin-walled structures. 19 Ref., 14 Fig.
Keywords: thin-walled structures, stress-strain state, finite element method, Fourier analysis, non-destructive testing, laser interferometry, shearography, autoXmated defect detection

Received: 12.07.2026
Received in revised form: 20.08.2026
Accepted: 06.09.2026
Posted online: 22.09.2026

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Suggested Citation

L.M. Lobanov, I.L. Shkurat, O.P. Shutkevych, I.V. Kyianets, V.V. Savitsky (2026) Automated detection of defective areas in a multilayer thin-walled structure with periodic configuration by laser interferometry methods. Technical Diagnostics and Non-Destructive Testing, 03, 28-37.

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