The Paton Welding Journal, 2026, №09

2026 №09 (01)

DOI of Article 10.37434/tpwj2026.09.02

2026 №09 (03)

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The Paton Welding Journal, 2026, #9, 28-34 pages

Spectral correspondence of X-ray screen to the sensor in X-ray television systems

S.R. Mikhailov^1,2

¹National Technical University of Ukraine “Igor Sikorsky Kyiv Polytechnic Institute” 37 Prosp. Beresteiskyi, 03056, Kyiv, Ukraine E-mail: smihajlov@ukr.net
²E.O. Paton Electric Welding Institute of the NASU. 11 Kazymyr Malevych Str., 03150, Kyiv, Ukraine.

Abstract
Film radiography is still a common method of non-destructive quality control of materials and products in all industries due to a well-developed regulatory framework and existing infrastructure (photographic laboratories, equipment, qualified personnel, etc.). However, significant shortcomings of film radiography (low productivity and high cost of control, inability to control objects in real time) stimulate the development of new methods of recording X-ray images, including digital radiography. Digital radiography is realized with the help of digital X-ray television systems. Currently, various digital X-ray TVs are used: systems based on X-ray electron-optical transducers, scanning systems based on linear detectors, systems based on semiconductor flat panel detectors, systems of the type of X-ray screen – optics – CCD- (CMOS-) sensor and others. The latter systems have a number of advantages over others: high control sensitivity and spatial resolution; the ability to change the X-ray scintillation screen, which allows changing the size of the working field and other system parameters; short image acquisition time; simple design; small dimensions and weight; and low cost. High-sensitivity CCD- (CMOS-) sensors, bright lenses, and high-conversion X-ray screens are used to ensure high control sensitivity. However, an important condition for achieving high control sensitivity is the compliance of the spectral characteristic of X-ray radiation with the spectral characteristic of the sensitivity of the CCD-(CMOS-) sensor. Therefore, the study of the spectral correspondence of a number of modern CCD-(CMOS-) sensors to the most common and efficient X-ray screens is the aim of the work. Spectral correspondence coefficients were calculated for scintillation X-ray screens for CCD- and CMOS-sensors. The ratio of the sensitivity of CCD- and CMOS-sensors to the spectrum emitted by the screen to the maximum sensitivity of the sensor is used for calculation of the coefficient of spectral correspondence. The table of the coefficients of spectral correspondence of X-ray screens to CCD-(CMOS-) sensors was constructed. It was found that the combinations of the Gd2O2S (Tb) screen and ICX285AL CCD sensor; IMX421 CMOS-sensor, ICX674ALG CCD-sensor, MT9M034, and IMX174 CMOS-sensors have the best spectral agreement.
Keywords: digital radiography, X-ray television system, X-ray screen, CCD-sensor, CMOS-sensor, mutual spectral matching

Received: 30.03.2026
Received in revised form: 27.04.2026
Accepted: 24.09.2026

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Suggested Citation

S.R. Mikhailov (2026) Spectral correspondence of X-ray screen to the sensor in X-ray television systems. The Paton Welding J., 09, 28-34. https://doi.org/10.37434/tpwj2026.09.02

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